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    谢湘华, 董亚明, 陈建华, 沈冬, 叶汝强. 改进旋涂法制备纳米粉体分析样品[J]. 华东理工大学学报(自然科学版), 2007, (2): 223-226.
    引用本文: 谢湘华, 董亚明, 陈建华, 沈冬, 叶汝强. 改进旋涂法制备纳米粉体分析样品[J]. 华东理工大学学报(自然科学版), 2007, (2): 223-226.
    XIE Xiang-hua, DONG Ya-ming, CHEN Jian-hua, SHEN Dong, YE Ru-qiang. Nano Powder Sample Preparation with Improved Spin-Coating Method[J]. Journal of East China University of Science and Technology, 2007, (2): 223-226.
    Citation: XIE Xiang-hua, DONG Ya-ming, CHEN Jian-hua, SHEN Dong, YE Ru-qiang. Nano Powder Sample Preparation with Improved Spin-Coating Method[J]. Journal of East China University of Science and Technology, 2007, (2): 223-226.

    改进旋涂法制备纳米粉体分析样品

    Nano Powder Sample Preparation with Improved Spin-Coating Method

    • 摘要: 介绍了一种改进旋涂法——DDS涂膜法(Deposit-Dip-Spin-coating),主要用来制备纳米粉体原子力显微镜(AFM)分析样品。DDS法在保证有足够多的纳米颗粒吸附在云母表面的同时,还增大了溶剂的挥发速度,颗粒的运动局限在一个很小的区域,减小了干燥过程中的团聚,纳米颗粒得到很好的分散。采用DDS法制备PbZr0.90Ti0.10O3-Fe0.003(PZT-Fe)纳米粉体样品,得到了清晰的AFM图像。结合扫描电镜(SEM)、透射电镜(TEM)、X射线衍射(XRD)分析,对样品均匀性、可调因素和测量准确性进行了探索,表明DDS法制备的样品质量好,AFM图像直观、真实地反映了纳米晶体的粒径分布情况。

       

      Abstract: Deposit-dip-spin(DDS) coating method,a composite nano-powder sample preparation method for atomic force microscope(AFM) measurement is introduced.DDS method ensures the deposition of enough particles on mica substrate to well simulate the distributing of the particles in the sol.While rapid evaporation speed disperses and freezes particles on a certain position.Clear AFM images were(obtained) from PbZr_(0.90)Ti_(0.10)O_3-Fe_(0.003) nano powder sample prepared by DDS method.Data analysis of AFM images and scanning electron microscope(SEM) photo well show the topographic details and grain size of particles.And the(statistical) result matches with transmission electron microscope(TEM) image and(X-ray) diffraction(XRD) data.

       

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