Application of XPS in Semi-quantitative Estimation of Ce³⁺ in YAG:Ce³⁺ Phosphor

XPS analysis is used to determine the percentage of Ce³⁺ in YAG:Ce³⁺ phosphor as a semi-quantitative method. In order to confirm the relationship between the luminescence and the percentage of Ce³⁺ more clearly, a series of YAG:Ce³⁺ phosphors were prepared under different sintering atmospheres. The results indicate that the relative percentages of Ce³⁺(f_Ce³⁺, estimated as peak area of Ce³⁺ to Ce³⁺+Ce⁴⁺) are 88.46%, 77.55%, 75.33% and 68.14%, respectively, corresponding to CO + N₂、CO、N₂ and air atmosphere by means of peak separation and fitting. The emission intensity of YAG:Ce³⁺ phosphor increased significantly with increasing Ce³⁺ concentration.