Abstract:
Scaning electron micrscopy (SEM), energy despersive X ray analysis (EDX) and optical microscope were used to study the Hg 1- x Cd x Te liquid phase epitaxial (LPE) films. The results showed that the epi film morphology depended upon the substrate quality, the substrate preparation and growth condition. Quality substrate without grain boundary is the prerequisite for the production of perfect epi film. While a protected coverage on the substrate during the homogenization period and melt back LPE growth mode are also helpful to improve the surface morphology and quality.